The DIGIT 1000 control system represents a significant milestone in the history of materials testing technology. Developed by ZwickRoell, it was one of the first systems to successfully replace the previously dominant analog measurement and control electronics. This shift to digital technology allowed for a level of precision, repeatability, and data integration that was previously unattainable in mechanical testing.

The Transition from Analog to Digital

Prior to the DIGIT 1000, testing machines relied on analog circuits which were prone to drift and required frequent manual calibration. The DIGIT 1000 introduced a microprocessor-based architecture that digitized signals for load, crosshead displacement, and strain directly at the source. This innovation not only improved the accuracy of the measurements but also enabled more complex control modes, such as constant strain rate or stress-controlled testing cycles.

Connectivity and Early Data Acquisition

One of the defining features of the DIGIT 1000 was its integration of the RS-232 interface. This allowed testing machines to be connected to early personal computers for the first time. It paved the way for automated data acquisition and the development of early software solutions, which eventually evolved into modern platforms like testXpert. By moving data processing from paper charts to digital files, the DIGIT 1000 fundamentally changed how research laboratories managed their experimental results.

Legacy and Modern Retrofitting

While the DIGIT 1000 has since been succeeded by the testControl and testControl II series, many machines equipped with this system are still in operation or have become candidates for modern retrofitting. Understanding the DIGIT 1000 logic is essential for maintenance technicians and for those looking to upgrade older Zwick machines to modern digital standards while retaining the high-quality mechanical frames of the original equipment.

Key Historical Features

• Digital PID Control: Minimized overshoot and improved stability during load-sensitive tests.
• Modular Sensor Inputs: Supported various load cells and extensometers via digital plug-in cards.
• Standardized Communication: Allowed for standardized reporting through serial printer or PC connection.